RAVIRAJ D, Vivek. The Low Power Aware ATPG For Scan Based Testing. International Journal of Science and Engineering Invention, [S. l.], v. 11, n. 11, p. 161–167, 2025. DOI: 10.23958.304. Disponível em: https://ijsei.in/index.php/ijsei/article/view/304. Acesso em: 12 nov. 2025.